{"created":"2023-06-20T16:37:33.070398+00:00","id":7324,"links":{},"metadata":{"_buckets":{"deposit":"5ad725d4-cd48-4311-a6e6-1c5d5861fad3"},"_deposit":{"created_by":3,"id":"7324","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7324"},"status":"published"},"_oai":{"id":"oai:kindai.repo.nii.ac.jp:00007324","sets":["14:923:1711:1719","21:3039:3241:3286"]},"author_link":["12537","12538"],"item_2_alternative_title_3":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"〈Original Papers〉Influence of Device Temperature on Luminance Decay in Organic Light-Emitting Diode"}]},"item_2_biblio_info_21":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-12-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"45","bibliographicPageEnd":"82","bibliographicPageStart":"79","bibliographic_titles":[{"bibliographic_title":"近畿大学工学部研究報告"},{"bibliographic_title":"Research reports of the Faculty of Engineering, Kinki University","bibliographic_titleLang":"en"}]}]},"item_2_description_33":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"[Abstract] The influence of device temperature on luminance decay in organic light-emitting diode (OLED) was investigated experimentally under the various conditions of driving current. The device temperature was raised within two degrees. The contributions of it to the degradation characteristics of OLED would be little in several-minutes operation.","subitem_description_type":"Abstract"}]},"item_2_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"MASUDA, Ken-ichi","subitem_description_type":"Other"}]},"item_2_description_41":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_2_publisher_14":{"attribute_name":"出版者 名前","attribute_value_mlt":[{"subitem_publisher":"近畿大学工学部"}]},"item_2_source_id_22":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0386491X","subitem_source_identifier_type":"ISSN"}]},"item_2_text_7":{"attribute_name":"著者(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"MASUDA, Kenichi"},{"subitem_text_language":"en","subitem_text_value":"OKADA, Kazuyuki"}]},"item_2_text_8":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"近畿大学大学院システム工学研究科"},{"subitem_text_value":"近畿大学工学部電子情報工学科"}]},"item_2_text_9":{"attribute_name":"著者所属(翻訳)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Systems Engineering, Kinki University"},{"subitem_text_value":"Department of Electronic Engineering and Computer Science, Faculty of Engineering, Kinki University"}]},"item_2_version_type_12":{"attribute_name":"版","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"増田,  研一"},{"creatorName":"マツダ, ケンイチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岡田,  和之"},{"creatorName":"オカダ, カズユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-02-18"}],"displaytype":"detail","filename":"AN00063799-20111220-0079.pdf","filesize":[{"value":"356.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"AN00063799-20111220-0079.pdf","url":"https://kindai.repo.nii.ac.jp/record/7324/files/AN00063799-20111220-0079.pdf"},"version_id":"6d8e63c5-dbac-4c50-9e9e-529da0eeb004"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Organic Light-Emitting Diode","subitem_subject_scheme":"Other"},{"subitem_subject":"Device Temperature","subitem_subject_scheme":"Other"},{"subitem_subject":"Degradation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"〈研究論文〉有機ＥＬ強度低下に及ぼす素子温度の影響","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"〈研究論文〉有機ＥＬ強度低下に及ぼす素子温度の影響"}]},"item_type_id":"2","owner":"3","path":["1719","3286"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-03-07"},"publish_date":"2012-03-07","publish_status":"0","recid":"7324","relation_version_is_last":true,"title":["〈研究論文〉有機ＥＬ強度低下に及ぼす素子温度の影響"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-21T00:18:35.096705+00:00"}