{"created":"2023-06-20T16:33:54.853417+00:00","id":2960,"links":{},"metadata":{"_buckets":{"deposit":"aa94cbeb-504b-4ee4-ad62-e6267ab32e8a"},"_deposit":{"created_by":3,"id":"2960","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"2960"},"status":"published"},"_oai":{"id":"oai:kindai.repo.nii.ac.jp:00002960","sets":["14:2667:2668","21:2669:2670"]},"author_link":["3130"],"item_8_alternative_title_3":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Refinement of surface analysis of nanoparticle with surface modification by using ATR-FUV measurement"}]},"item_8_biblio_info_21":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-01-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"4","bibliographicPageStart":"1","bibliographic_titles":[{"bibliographic_title":"科学研究費助成事業研究成果報告書 (2014. )"}]}]},"item_8_description_33":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"研究成果の概要（和文): ポリスチレンナノ粒子（PSNP）および表面修飾されたPSNPの電子状態を多角入射減衰全反射遠紫外分光法（VIA-ATR-FUV）によって測定した. VIA-ATR-FUVは, 固体試料の遠紫外スペクトルを測定し, 表面からの深さの変化を研究することができる. PSNPを規則正しく配置し凹凸ある面での測定精度向上を目指して研究を行い, 波長より大きいPSNPではエバネッセント波の散乱の影響を受けること, 一方で, より小さなナノ粒子のスペクトルはPS均一膜と同様のスペクトルが観測された. 電磁波計算との比較により, 表面100nm以内に焦点を当てた電子状態分析の可能性を見出した.                    研究成果の概要（英文): Electronic states of polystyren nano particle (PSNP) whose diameters are 50-500 nm and surface modificated PSNSP were observed by variable-incidence-angle (VIA) measurement of attenuated total reflectance spectroscopy in the far-ultraviolet region (ATR-FUV). The VIA-ATR-FUV has enabled us to measure the FUV spectra for solid samples without peak-saturation by nitrogen gas purge, and to study the variation in the depth from the surface. In order to arrange the PSNP on the surface with regularity, spin coater was used to form films. The spectra of spin-coated PSNP film could be measured with good reproducibility. It was found that PSNP with larger diameters than wavelength are strongly affected by the real part of refractive index, that is effect of scattering, on the other hand, the spectra of the smaller nano-particle was similar to that of the uniform PS film. The variation in the depth were analyzed by using FDTD method of electromagnetic wave.","subitem_description_type":"Abstract"}]},"item_8_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究種目：若手研究(B);  研究期間：2013～2014;   課題番号：25870938;   研究分野：分子分光学;   科研費の分科・細目：","subitem_description_type":"Other"}]},"item_8_description_37":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Research Paper","subitem_description_type":"Other"}]},"item_8_description_41":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_8_publisher_14":{"attribute_name":"出版者 名前","attribute_value_mlt":[{"subitem_publisher":"近畿大学"}]},"item_8_relation_11":{"attribute_name":"著者 外部リンク","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/d/r/60510021.ja.html"}]}]},"item_8_text_10":{"attribute_name":"著者 役割","attribute_value_mlt":[{"subitem_text_value":"研究代表者"}]},"item_8_text_7":{"attribute_name":"著者(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"MORISAWA, Yusuke"}]},"item_8_text_8":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"近畿大学理工学部; 講師"}]},"item_8_text_9":{"attribute_name":"著者所属(翻訳)","attribute_value_mlt":[{"subitem_text_value":"Kinki University"}]},"item_8_version_type_12":{"attribute_name":"版","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"森澤,  勇介"},{"creatorName":"モリサワ, ユウスケ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"3130","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60510021","nameIdentifierScheme":"研究者番号","nameIdentifierURI":" "}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-02-17"}],"displaytype":"detail","filename":"25870938seika.pdf","filesize":[{"value":"319.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"25870938seika.pdf","url":"https://kindai.repo.nii.ac.jp/record/2960/files/25870938seika.pdf"},"version_id":"aec15d67-64d4-4693-b291-3934a6ceabe3"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"遠紫外分光学","subitem_subject_scheme":"Other"},{"subitem_subject":"ポリスチレンナノ粒子","subitem_subject_scheme":"Other"},{"subitem_subject":"減衰全反射法","subitem_subject_scheme":"Other"},{"subitem_subject":"電子状態","subitem_subject_scheme":"Other"},{"subitem_subject":"表面分析","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"表面修飾ナノ粒子分析を目指した, ＡＴＲ－ＦＵＶ分光測定による分析深さの精密化","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"表面修飾ナノ粒子分析を目指した, ＡＴＲ－ＦＵＶ分光測定による分析深さの精密化"}]},"item_type_id":"8","owner":"3","path":["2668","2670"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-11-19"},"publish_date":"2015-11-19","publish_status":"0","recid":"2960","relation_version_is_last":true,"title":["表面修飾ナノ粒子分析を目指した, ＡＴＲ－ＦＵＶ分光測定による分析深さの精密化"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-21T01:51:11.767171+00:00"}